A new production test system from Teradyne measures spectral response and per pixel luminance to enable the high volume manufacturing of microLED devices. The Iris 100 tool validates microLED arrays for use in AI data center optical interconnects, providing a path for scale up architectures to move beyond copper constraints. The system performs both optical and electrical measurements in a single insertion to increase throughput across wafer, die, and module stages.

The company positions microLED technology alongside silicon photonics and co packaged optics as a standard for next generation AI connectivity. This move toward production ready infrastructure marks a shift for the technology from lab prototypes to a scalable manufacturing ecosystem. Each optical transceiver requires the validation of hundreds of emitters before they are integrated onto silicon for volume shipping.